Method and apparatus for measuring temperature

专利名称：Method and apparatus for measuring

temperature

发明人：Benny Pesach,Gabriel Bitton,Allan C. Entis申请号：US11409936申请日：20060424

公开号：US20060251146A1公开日：20061109

专利附图：

摘要：A method for determining concentration of at least one component of thematerial, the method comprising: measuring at least one of the real and imaginary partsof the permittivity of the material at each of a first plurality of frequencies for which

substantially only a second plurality of known components of the material contributes tothe dielectric permittivity of the material, wherein for each of the known components thepermittivity as a function of temperature is known and the first plurality is greater thanthe second plurality; determining the concentration of at least one of the knowncomponents responsive to a solution of a set of simultaneous equations determined bythe first plurality of measurements and the dependence of the permittivities of theknown components on temperature.

申请人：Benny Pesach,Gabriel Bitton,Allan C. Entis

地址：Rosh-Ha'ayin IL,Jerusalem IL,Tel-Aviv IL

国籍：IL,IL,IL

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